HP-Agilent/Keysight 4279A

C-V measurement for performing doping profile of wafers. C-V characterization and sorting of varactor diodes. Capacitance testing of rf mixer and switching diodes. Testing capacitors with an applied DC bias for incoming inspection. Measurement Time: 10ms/20ms/30ms Measurement Accuracy: 0.1% (20ms) Internal DC Bias: 0 to +/-38V, 0.1% programmable sweep Measurement Range: 0.00001pF to 1280pF