Fast-sweeping built-in synthesized source with optional 1 Hz frequency resolution Integrated switching test set measures all four S-parameters with a single connection Vector accuracy enhancement Optional time domain capability computes and displays response versus time or distance Optional solid state switch allows simultaneous measurement of forward and reverse parameters and continuous update for all four s-parameters as required for two-part error correction Productivity is enhanced with pass/fail testing, direct printer/plotter output of results, advanced marker functions, and save/recall of test configurations. Two independent display channels for simultaneous measurement of reflection and transmission characteristics
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