Microwave
Showing all 11 results
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Frequency Counter, Microwave
EIP 5484
The 548B Microwave Frequency Counter has automatic amplitude discrimination which enables the instrument to automatically select and measure the input signal with the highest level, and ignore all of the harmonics and other spurious signals that are present. The frequency range is 10Hz to 26.5GHz. Keyboard controlled frequency limit selection Power measurement to 0.1 dB resolution Power measurement accuracy to ?0.5 dB typical -30 dBm Sensitivity 200 Watt (+53 dBm) peak damage protection 10 dB automatic amplitude discrimination 200 ms acquisition time Up to 600MHz/sec tracking speed 20MHz P-P FM tolerance up to a 10MHz rate
SKU: n/a -
Microwave
INTER-CONTINENTAL MICROWAVE TF-3001-E
The ICM Adjustable Test Fixture Mainframe Series TF-3000 provides a highly flexible test platform for microwave semiconductor measurements, such as S-parameters, noise figure, etc. Both RF-launches can be adjusted in y and z axis to accommodate DUTs with offsets and different substrate thickness'.
Full compatibility with all Midsections and Calibration Kits is maintained. The concept of having a mainframe with plug-in type midsections makes it a very adaptable and cost-effective solution. De-embedding can be done easily with available TRL or TOSL Calibration Standards.
Many different midsections are available for FET-chip measurements, Bipolar-Chip measurements, MMIC-Chip measurements, and Packaged transistors (low noise to power devices). Excellent RF characteristics and measurement repeatability are designed into the basic fixture. Replaceable Connector Transition Assemblies allow the use of APC-7, APC-3.5, SuperSMA, K and 2.4mm connectors to be used with the same mainframe (male and female interfaces available).SKU: n/a
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Frequency Counter, Microwave
EIP 5484
The 548B Microwave Frequency Counter has automatic amplitude discrimination which enables the instrument to automatically select and measure the input signal with the highest level, and ignore all of the harmonics and other spurious signals that are present. The frequency range is 10Hz to 26.5GHz. Keyboard controlled frequency limit selection Power measurement to 0.1 dB resolution Power measurement accuracy to ?0.5 dB typical -30 dBm Sensitivity 200 Watt (+53 dBm) peak damage protection 10 dB automatic amplitude discrimination 200 ms acquisition time Up to 600MHz/sec tracking speed 20MHz P-P FM tolerance up to a 10MHz rate
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Microwave
INTER-CONTINENTAL MICROWAVE TF-3001-E
The ICM Adjustable Test Fixture Mainframe Series TF-3000 provides a highly flexible test platform for microwave semiconductor measurements, such as S-parameters, noise figure, etc. Both RF-launches can be adjusted in y and z axis to accommodate DUTs with offsets and different substrate thickness'.
Full compatibility with all Midsections and Calibration Kits is maintained. The concept of having a mainframe with plug-in type midsections makes it a very adaptable and cost-effective solution. De-embedding can be done easily with available TRL or TOSL Calibration Standards.
Many different midsections are available for FET-chip measurements, Bipolar-Chip measurements, MMIC-Chip measurements, and Packaged transistors (low noise to power devices). Excellent RF characteristics and measurement repeatability are designed into the basic fixture. Replaceable Connector Transition Assemblies allow the use of APC-7, APC-3.5, SuperSMA, K and 2.4mm connectors to be used with the same mainframe (male and female interfaces available).
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Frequency Counter, Microwave
EIP 5484
The 548B Microwave Frequency Counter has automatic amplitude discrimination which enables the instrument to automatically select and measure the input signal with the highest level, and ignore all of the harmonics and other spurious signals that are present. The frequency range is 10Hz to 26.5GHz. Keyboard controlled frequency limit selection Power measurement to 0.1 dB resolution Power measurement accuracy to ?0.5 dB typical -30 dBm Sensitivity 200 Watt (+53 dBm) peak damage protection 10 dB automatic amplitude discrimination 200 ms acquisition time Up to 600MHz/sec tracking speed 20MHz P-P FM tolerance up to a 10MHz rate
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Microwave
INTER-CONTINENTAL MICROWAVE TF-3001-E
The ICM Adjustable Test Fixture Mainframe Series TF-3000 provides a highly flexible test platform for microwave semiconductor measurements, such as S-parameters, noise figure, etc. Both RF-launches can be adjusted in y and z axis to accommodate DUTs with offsets and different substrate thickness'.
Full compatibility with all Midsections and Calibration Kits is maintained. The concept of having a mainframe with plug-in type midsections makes it a very adaptable and cost-effective solution. De-embedding can be done easily with available TRL or TOSL Calibration Standards.
Many different midsections are available for FET-chip measurements, Bipolar-Chip measurements, MMIC-Chip measurements, and Packaged transistors (low noise to power devices). Excellent RF characteristics and measurement repeatability are designed into the basic fixture. Replaceable Connector Transition Assemblies allow the use of APC-7, APC-3.5, SuperSMA, K and 2.4mm connectors to be used with the same mainframe (male and female interfaces available).